Electro-Optic Measurement Techniques for Picosecond Materials, Devices, and Integrated Circuits

Semiconductors and Semimetals

Volumn 28, Issue C, 1990, Pages 135-219

  Valdmanis, J A ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TIMING CIRCUITS;

ELECTRO-OPTIC MEASUREMENTS; PICOSECONDS;

INTEGRATED CIRCUITS;

EID: 77956952115     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)62786-6     Document Type: Article

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