A class of multivanate failure time distributions

Biometrika

Volumn 73, Issue 3, 1986, Pages 671-678

  Hougaard, Philip ^a  

^a Novo Research Institute   (Denmark)

Author keywords

Heterogeneity; Matched pairs; Positive stable distribution; Survival data; Weibull distribution

Indexed keywords

EID: 77956889117     PISSN: 00063444     EISSN: None     Source Type: Journal    
DOI: 10.1093/biomet/73.3.671     Document Type: Article

References (0)