X-Ray Diffraction Study of Micro Amounts of Polycrystalline Samples

Journal of Structural Chemistry

Volumn 51, Issue 4, 2010, Pages 744-757

  Alexeev, A V ^a   Gromilov, S A ^a,b  

^a NIKOLAEV INSTITUTE OF INORGANIC CHEMISTRY   (Russian Federation)

^b NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

Author keywords

accuracy; CCD detector; Debye Scherrer method; preferred orientation; reference; unit cell parameters

Indexed keywords

EID: 77956834827     PISSN: 00224766     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10947-010-0110-3     Document Type: Article

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