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Volumn , Issue , 2000, Pages 69-70
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Yield improvement and repair trade-off for large embedded memories
a
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Author keywords
BIST; DFM; Silicon repair; Yield improvement
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Indexed keywords
DESIGN-FOR-MANUFACTURABILITY;
DFM;
EMBEDDED MEMORY;
MANUFACTURING COST;
REDUNDANCY ANALYSIS;
SYSTEM ON CHIP DESIGN;
YIELD IMPROVEMENT;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
BUILT-IN SELF TEST;
EXHIBITIONS;
MACHINE DESIGN;
SILICON;
REPAIR;
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EID: 77956830995
PISSN: 15301591
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/DATE.2000.840018 Document Type: Conference Paper |
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Times cited : (3)
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References (0)
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