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Volumn 23, Issue 9-10, 2010, Pages 5-8
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Static analysis is not just for finding bugs
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL SOFTWARE;
TWO-PHASE PROCESS;
STATIC ANALYSIS;
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EID: 77956754448
PISSN: None
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
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References (12)
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