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Volumn 11, Issue C, 2006, Pages 67-87

Chapter 3 Diffuse double layer equations for use in surface complexation models: approximations and limits

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EID: 77956722866     PISSN: 15734285     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1573-4285(06)80047-5     Document Type: Chapter
Times cited : (6)

References (22)
  • 9
    • 0003514266 scopus 로고    scopus 로고
    • Chapter 1. Ohshima H., and Furusawa K. (Eds), Dekker, New York
    • Chapter 1. Ohshima H. In: Ohshima H., and Furusawa K. (Eds). Electrical Phenomena at Interfaces (1998), Dekker, New York
    • (1998) Electrical Phenomena at Interfaces
    • Ohshima, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.