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Volumn 82, Issue 3, 2010, Pages

Hall effect measurements and electronic structure calculations on YbRh 2 Si2 and its reference compounds LuRh2 Si 2 and YbIr2 Si2

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EID: 77956656809     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.035103     Document Type: Article
Times cited : (48)

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