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Volumn , Issue , 2010, Pages 370-371
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Johnson-Nyquist noise of the quantized Hall resistance
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Author keywords
[No Author keywords available]
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Indexed keywords
EXTERNAL CURRENTS;
MEASURING TECHNIQUE;
NYQUIST NOISE;
QUANTIZED HALL RESISTANCE;
QUANTUM HALL;
QUANTUM HALL EFFECT;
ELECTRIC RESISTANCE MEASUREMENT;
ELECTROMAGNETISM;
HALL EFFECT;
MAGNETIC FIELD EFFECTS;
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EID: 77956627963
PISSN: 05891485
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CPEM.2010.5544244 Document Type: Conference Paper |
Times cited : (1)
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References (7)
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