Automatic optical flank wear measurement of microdrills using level set for cutting plane segmentation

Machine Vision and Applications

Volumn 21, Issue 5, 2010, Pages 667-676

  Duan, Guifang ^c   Chen, Yen Wei ^a   Sukegawa, Takeshi ^b  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b Technical and Development Division   (Japan)

^c NONE

Author keywords

Automatic optical inspection; Cutting plane segmentation; Level set; Microdrill bit; Wear measurement

Indexed keywords

AUTOMATIC OPTICAL INSPECTION; CUTTING PLANE SEGMENTATION; LEVEL SET; MICRO DRILLS; WEAR MEASUREMENTS;

DRILLS; FEATURE EXTRACTION; IMAGE SEGMENTATION; INSPECTION; OPTICAL TESTING; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE;

MEASUREMENTS;

EID: 77956616794     PISSN: 09328092     EISSN: 14321769     Source Type: Journal    
DOI: 10.1007/s00138-010-0259-y     Document Type: Article

References (20)

1. Su, J. C., Huang, C. K., Tang, Y. S.: An automatic flank wear measurement of microdrills using machine vision. J. Mater. Process. Technol. 180, 328-335 (2006)
2. Tien, F.-C., Yeh, C.-H., Hsieh, K.-H.: Automated visual inspection for microdrills in printed circuit board production. Int. J. Prod. Res. 42 (12), 2477-2495 (2004)
3. Moganti, M., Ercal, F., Dagli, C. H., Tsunekawa, S.: Automatic PCB inspection algorithms: a survey. Comput. Vis. Image Underst. 63 (2), 287-313 (1996)
4. Bayro-Corrochano, E. J.: Review of automated visual inspection 1983 to 1993. Part I: conventional approaches. SPIE Intell Robots Comput Vis XII 2055, 128-158 (1993)
5. Zhang, W. J., Li, D., Ye, F., Sun, H.: Automatic optical defect inspection and dimension measurement of drill bit. In: IEEE International Conference on Mechatronics and Automation, pp. 95-100 (2006)
6. Huang, C. K., Liaol, C. W., Huang, A. P., Tarng, Y. S.: An automatic optical inspection of drill point defects for micro-drilling. Int. J. Adv. Manuf. Technol. 37, 1133-1145 (2007)
7. Brox, T., Weickert, J.: Level set based image segmentation with multiple regions. Pattern Recognit. 3175, 415-423 (2004)
8. Han, X., Xu, C., Prince, J.: A topology preserving level setmethod for geometric deformable models. IEEE Trans. Pattern Anal. Mach. Intell. 25, 755-768 (2003)
9. Caselles, V., Catte, F., Coll, T., Dibos, F.: A geometric model for active contours in image processing. Numer. Math. 66, 1-31 (1993)
10. Martin, P., Refregier, P., Goudail, F., Guerault, F.: Influence of the noise model on level set active contour segmentation. IEEE Trans. Pattern Anal. Mach. Intell. 26 (6), 799-803 (2004)
11. Paragios, N., Deriche, R.: Geodesic active contours and level sets for the detection and tracking of moving objects. IEEE Trans. Pattern Anal. Mach. Intell. 22 (3), 266-280 (2000)
12. Li, C., Xu, C., Gui, C., Fox, M. D.: Level set evolution without re-initialization: a new variational formulation. Int. Conf. Comput. Vis. Pattern Recognit. 1, 430-436 (2005)
13. Osher, S., Sethian, J. A.: Fronts propagating with curvature-dependent speed: algorithms based on Hamilton-Jacobi formulations. J. Comput. Phys. 19, 12-49 (1988)
14. Deng, J. W.: A fast level set method for segmentation of low contrast noisy biomedical images. Pattern Recognit. Lett. 23, 161-169 (2002)
15. Osher, S., Fedkiw, R.: Level Set Methods and Dynamic Implict Surfaces. Springer-Verlag, Berlin (2003)
16. Osher, S., Fedkiw, R. P.: Level set methods: an overview and some recent results. J. Comput. Phys. 169, 463-502 (2001)
17. Weeratunga, S. K., Kamath, C.: An investigation of implicit active contours for scientific image segmentation. In: Visual Communications and Image Processing Conference (2003)
18. Jain, R., Kasturi, R., Schunck, B. G.: Machine Version. McGraw-Hill, New York (1995)
19. Duan, G. F., Chen, Y. W., Sukegawa, T.: Automatic optical phase identification of microdrill bits in printed circuit board manufacturing. IEEJ Trans. Electron. Inf. Syst. 129 (7), 1397-1407 (2009)
20. Vese, L. A., Chan, T. F.: A multiphase level set framework for image segmentation using the Mumford and Shah model. Int. J. Comput. Vis. 50 (3), 271-293 (2002)