Direct measurement of double-layer, van der waals, and polymer depletion attraction forces between supported cationic bilayers

Langmuir

Volumn 26, Issue 18, 2010, Pages 14458-14465

  Anderson, Travers H ^a   Donaldson, Stephen H ^a   Zeng, Hongbo ^b   Israelachvili, Jacob N ^a  

^a University of California   (United States)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM CHLORIDE; BI-LAYER; BILAYER SURFACE; CATIONIC POLYELECTROLYTE; CHARGE REGULATION; DEPLETION ATTRACTION; DIRECT MEASUREMENT; DLVO THEORY; DOUBLE LAYERS; DOUBLE-LAYER REPULSION; ETHYL ESTERS; LANGMUIR BLODGETT TECHNIQUES; MICA SURFACES; NONADSORBING POLYMERS; NONIONIC POLYMERS; POLYMER DEPLETION; POLYMER MOLECULAR WEIGHT; RATE EFFECTS; STANDARD THEORIES; SURFACE FORCES APPARATUS; VAN DER WAALS;

AMMONIUM COMPOUNDS; CALCIUM CHLORIDE; CATIONIC SURFACTANTS; ESTERS; MICA; POLYELECTROLYTES; SILICATE MINERALS; VAN DER WAALS FORCES;

DYES;

CALCIUM CHLORIDE; DITALLOW DIMETHYLAMMONIUM; ELECTROLYTE; POLYMER; QUATERNARY AMMONIUM DERIVATIVE; SURFACTANT; WATER;

ARTICLE; CHEMISTRY; KINETICS; STATIC ELECTRICITY; SURFACE PROPERTY;

CALCIUM CHLORIDE; ELECTROLYTES; KINETICS; POLYMERS; QUATERNARY AMMONIUM COMPOUNDS; STATIC ELECTRICITY; SURFACE PROPERTIES; SURFACE-ACTIVE AGENTS; WATER;

EID: 77956579313     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la1020687     Document Type: Article

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