Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007

Volumn , Issue , 2007, Pages 799-804

  Robson, Norm ^a   Safran, John ^a   Kothandaraman, Chandrasekharan ^a   Cestero, Alberto ^a   Chen, Xiang ^a   Rajeevakumar, Raj ^a   Leslie, Alan ^a   Moy, Dan ^a   Kirihata, Toshiaki ^a   Iyer, Subramanian ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS;

45NM TECHNOLOGY; ANALOG DEVICES; BUILDING BLOCKES; ELECTRICAL FUSE; MEMORY REDUNDANCY;

REDUNDANCY;

EID: 77956554391     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2007.4405850     Document Type: Conference Paper

References (12)

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