Radon-like features and their application to connectomics

2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops, CVPRW 2010

Volumn , Issue , 2010, Pages 186-193

  Kumar, Ritwik ^a   Vázquez Reina, Amelio ^b   Pfister, Hanspeter ^a  

^a HARVARD UNIVERSITY   (United States)

^b Tufts University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND SEGMENTATION; CLUSTER DETECTION; CONNECTIVITY ANALYSIS; ELECTRON MICROGRAPH; FEATURE DESCRIPTORS; IMAGE STATISTICS; UNSUPERVISED LEARNING METHOD;

CELL MEMBRANES; COMPUTER VISION; CYTOLOGY; RADON; UNSUPERVISED LEARNING;

TECHNICAL PRESENTATIONS;

EID: 77956533677     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPRW.2010.5543594     Document Type: Conference Paper

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