Measurement of force curve due to electrostatic charge on a single particle using atomic force microscope

KONA Powder and Particle Journal

Volumn 26, Issue March, 2008, Pages 238-245

  Matsuyama, Tatsushi ^a   Ohtsuka, Masa Aki ^a   Yamamoto, Hideo ^a  

^a SOKA UNIVERSITY   (Japan)

Author keywords

Adhesive force measurement; Contact electrification; Coulomb s law; Electrostatic adhesion; Tribo charging; Tribo electrification

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE DENSITY; CHEMICAL BONDS; ELECTRIC UTILITIES; ELECTROSTATIC SEPARATORS; METALS; ZIRCONIUM;

ADHESIVE FORCE MEASUREMENT; CONTACT ELECTRIFICATION; ELECTROSTATIC ADHESION; TRIBOCHARGING; TRIBOELECTRIFICATION;

ELECTROSTATICS;

EID: 77956514911     PISSN: 02884534     EISSN: 21875537     Source Type: Journal    
DOI: 10.14356/kona.2008021     Document Type: Article

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