Measurement back-action in quantum point-contact charge sensing

Entropy

Volumn 12, Issue 7, 2010, Pages 1721-1732

  Küng, Bruno ^a   Gustavsson, Simon ^a,b   Choi, Theodore ^a   Shorubalko, Ivan ^a,c   Pfäffli, Oliver ^a   Hassler, Fabian ^a,d   Blatter, Gianni ^a   Reinwald, Matthias ^e   Wegscheider, Werner ^a,e   Schön, Silke ^a   Ihn, Thomas ^a   Ensslin, Klaus ^a  

^a ETH ZURICH   (Switzerland)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^d UNIVERSITEIT LEIDEN   (Netherlands)

^e UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

Noise; Quantum dots; Quantum wires; Single electron tunneling

Indexed keywords

EID: 77956399592     PISSN: None     EISSN: 10994300     Source Type: Journal    
DOI: 10.3390/e12071721     Document Type: Article

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