A method for achieving super-resolved widefield CARS microscopy

Optics Express

Volumn 18, Issue 18, 2010, Pages 19263-19272

  Hajek, Kim M ^a   Littleton, Brad ^a,b   Turk, Douglas ^a   McIntyre, Timothy J ^a   Rubinsztein Dunlop, Halina ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT SCATTERING; RAMAN SPECTROSCOPY;

APPLIED PHYSICS; COHERENT ANTI-STOKES RAMAN SCATTERING MICROSCOPY; DIFFRACTION-LIMITED RESOLUTION; NUMERICAL SIMULATION; STANDING WAVE PATTERNS; STRUCTURED ILLUMINATION; THEORETICAL TREATMENTS; WIDE FIELD OF VIEW; WIDE-FIELD;

RAMAN SCATTERING;

ALGORITHM; ARTICLE; COMPUTER SIMULATION; DIAGNOSTIC IMAGING; FOURIER ANALYSIS; IMAGE PROCESSING; LIGHT; METHODOLOGY; MICROSCOPY; OPTICS; OSCILLOMETRY; RADIATION SCATTERING; RAMAN SPECTROMETRY; STATISTICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; DIAGNOSTIC IMAGING; FOURIER ANALYSIS; IMAGE PROCESSING, COMPUTER-ASSISTED; LIGHT; MICROSCOPY; MODELS, STATISTICAL; OPTICS AND PHOTONICS; OSCILLOMETRY; SCATTERING, RADIATION; SPECTRUM ANALYSIS, RAMAN;

EID: 77956391547     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.019263     Document Type: Article

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