A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics

Applied Physics Letters

Volumn 97, Issue 9, 2010, Pages

  Mendis, B G ^a   Bowen, L ^a   Jiang, Q Z ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CDTE; CONTACTLESS METHODS; DIFFUSION LENGTH; GRAIN BOUNDARY RECOMBINATION VELOCITY; INDIVIDUAL GRAIN BOUNDARIES; MINORITY CARRIER DIFFUSION LENGTH; PHOTOVOLTAIC PERFORMANCE; RECOMBINATION VELOCITY; THIN FILM PHOTOVOLTAICS;

CADMIUM COMPOUNDS; EPITAXIAL FILMS; GRAIN BOUNDARIES;

GRAIN SIZE AND SHAPE;

EID: 77956358162     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3486482     Document Type: Article

References (16)

1. A. Shah, P. Torres, R. Tscharner, N. Wyrsch, and H. Keppner, Science SCIEAS 0036-8075 285, 692 (1999). 10.1126/science.285.5428.692
2. J. Toušková, D. Kindl, and J. Toušek, Thin Solid Films THSFAP 0040-6090 293, 272 (1997). 10.1016/S0040-6090(96)09113-4
3. K. Durose, P. R. Edwards, and D. P. Halliday, J. Cryst. Growth JCRGAE 0022-0248 197, 733 (1999). 10.1016/S0022-0248(98)00962-2
4. J. Nelson, The Physics of Solar Cells (Imperial College Press, London, 2003).
5. P. T. Landsberg, Recombination in Semiconductors (Cambridge University Press, Cambridge, 1991). 10.1017/CBO9780511470769
6. B. G. Yacobi and D. B. Holt, Cathodoluminescence Microscopy of Inorganic Solids (Plenum, New York, 1990).
7. C. M. Parish and P. E. Russell, Adv. Imaging Electron Phys. AIEPFQ 1076-5670 147, 1 (2007). 10.1016/S1076-5670(07)47001-X
8. W. Van Roosbroeck, J. Appl. Phys. JAPIAU 0021-8979 26, 380 (1955). 10.1063/1.1722002
9. C. Donolato, J. Appl. Phys. JAPIAU 0021-8979 54, 1314 (1983). 10.1063/1.332205
10. Q. Jiang, D. P. Halliday, B. K. Tanner, A. W. Brinkman, B. J. Cantwell, J. T. Mullins, and A. Basu, J. Phys. D: Appl. Phys. JPAPBE 0022-3727 42, 012004 (2009). 10.1088/0022-3727/42/1/012004
11. C. C. R. Watson and K. Durose, J. Cryst. Growth JCRGAE 0022-0248 126, 325 (1993). 10.1016/0022-0248(93)90040-4
12. J. I. Goldstein, D. E. Newbury, D. C. Joy, C. E. Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. R. Michael, Scanning Electron Microscopy and X-ray Microanalysis (Springer, New York, 2003).
13. D. R. Wight, D. Bradley, G. Williams, M. Astles, S. J. C. Irvine, and C. A. Jones, J. Cryst. Growth JCRGAE 0022-0248 59, 323 (1982). 10.1016/0022- 0248(82)90345-1
14. A. Castaldini, A. Cavallini, B. Fraboni, P. Fernandez, and J. Piqueras, J. Appl. Phys. JAPIAU 0021-8979 83, 2121 (1998). 10.1063/1.366946
15. R. Cohen, V. Lyahovitskaya, E. Poles, A. Liu, and Y. Rosenwaks, Appl. Phys. Lett. APPLAB 0003-6951 73, 1400 (1998). 10.1063/1.122169
16. T. H. Myers, S. W. Edwards, and J. F. Schetzina, J. Appl. Phys. JAPIAU 0021-8979 52, 4231 (1981). 10.1063/1.329272