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Volumn 622, Issue 2, 2010, Pages 453-455
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K0-INAA performance in the measurement of filters sampled in an industry with high loadings of metals
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Author keywords
Compton Suppression System; Foundry industry; INAA; PIXE; Risk assessment
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Indexed keywords
COMPTON SUPPRESSION;
DETECTION LIMITS;
FOUNDRY INDUSTRIES;
FOUNDRY INDUSTRY;
GERMANIUM CRYSTALS;
HIGH CONCENTRATION;
HIGH LOADINGS;
INAA;
INDUSTRIAL SECTOR;
INSTRUMENTAL NEUTRON ACTIVATION ANALYSIS;
OCCUPATIONAL HEALTH;
OCCUPATIONAL HEALTH RISK;
PARTICLE INDUCED X-RAY EMISSION;
PARTICULATE MATTER;
PHOTOPEAKS;
PIXE;
FOUNDRY PRACTICE;
GAMMA RAYS;
GERMANIUM;
HEALTH RISKS;
INDUSTRIAL HYGIENE;
INDUSTRY;
LEAD;
NEUTRON ACTIVATION ANALYSIS;
RISK ASSESSMENT;
SODIUM;
TIN;
ZINC;
OCCUPATIONAL RISKS;
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EID: 77956341013
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2010.02.054 Document Type: Conference Paper |
Times cited : (7)
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References (11)
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