Diseases and insect pests area monitoring for winter wheat based on HJ-CCD imagery

Nongye Gongcheng Xuebao/Transactions of the Chinese Society of Agricultural Engineering

Volumn 26, Issue 7, 2010, Pages 213-219

  Feng, Lian ^a   Wu, Wei ^b   Chen, Xiaoling ^a,c   Tian, Liqiao ^a   Cai, Xiaobin ^a   Su, Guozhen ^a  

^a WUHAN UNIVERSITY   (China)

^b Ministry of Civil Affairs   (China)

^c JIANGXI NORMAL UNIVERSITY   (China)

Author keywords

Charge coupled device (CCD); Diseases and insect pests; Logistic; Regression analysis; Vegetation index; Winter wheat

Indexed keywords

AREA MONITORING; BINARY LOGISTIC REGRESSION; CCD IMAGES; CROP DISEASE; ENVIRONMENT MONITORING; FIELD INVESTIGATION; HEALTH STATUS; HIGH RELIABILITY; INSECT PEST; MICRO SATELLITE; PLANT PROTECTION; RELATIONAL MODEL; THRESHOLD METHODS; VEGETATION INDEX; WINTER WHEAT;

CHARGE COUPLED DEVICES; CROPS; REGRESSION ANALYSIS; REMOTE SENSING; SURGE PROTECTION;

VEGETATION;

EID: 77956321609     PISSN: 10026819     EISSN: None     Source Type: Journal    
DOI: 10.3969/j.issn.1002-6819.2010.07.037     Document Type: Article

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