Spatial sensitivity mapping of Hall crosses using patterned magnetic nanostructures

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Alexandrou, M ^a   Nutter, P W ^a   Delalande, M ^b   De Vries, J ^b   Hill, E W ^a   Schedin, F ^a   Abelmann, L ^b   Thomson, T ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANOMALOUS HALL EFFECTS; BIT-PATTERNED MEDIA; CO/PT MULTILAYER; CROSS STRUCTURES; MAGNETIC NANOSTRUCTURES; MAGNETIC SWITCHING; NANO-ISLANDS; NUMERICAL SIMULATION STUDIES; OUTPUT VOLTAGES; PATTERNED MAGNETIC NANOSTRUCTURE; SEED LAYER; SPATIAL SENSITIVITY; SWITCHING BEHAVIORS; SWITCHING FIELD DISTRIBUTION; THEORETICAL STUDY; THREE DIMENSIONAL FINITE ELEMENT MODEL;

FINITE ELEMENT METHOD; HALL EFFECT; MAGNETIC FIELD EFFECTS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; PLATINUM; THREE DIMENSIONAL;

SWITCHING;

EID: 77956320086     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3475485     Document Type: Conference Paper

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