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Volumn 2010, Issue 558 CP, 2010, Pages

Optimized testing of modern protection equipment using transient simulation

Author keywords

Application oriented testing; black box testing; transient simulation; verification of relay settings

Indexed keywords

APPLICATION-ORIENTED TESTING; BLACK BOX TESTING; DESIGN PROCESS; IEC 61850; LOGICAL FUNCTIONS; LOGICAL PROCEDURES; NETWORK DATA; PROTECTION EQUIPMENT; PROTECTION FUNCTION; PROTECTION SYSTEMS; PROTECTION TESTING; PROTECTIVE FUNCTION; SIMULATED SIGNALS; TESTING STRATEGIES; TESTING TOOLS; TRANSIENT SIMULATION;

EID: 77956305269     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/cp.2010.0340     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 77956304652 scopus 로고    scopus 로고
    • Optimisation strategies for protection maintenance
    • Dornbirn
    • C. Mempel: Optimisation strategies for protection maintenance, OMICRON IPTS 2006, Dornbirn, www.omicron.at
    • OMICRON IPTS 2006
    • Mempel, C.1
  • 3
    • 77956330024 scopus 로고    scopus 로고
    • Contribution to cigre study committee b5 colloquium 2009 on strategies for the life-time maintenance of substation automation system
    • Korea
    • K. Yoda: Contribution to CIGRE Study Committee B5 Colloquium 2009 on "Strategies for the Life-Time Maintenance of substation Automation System", Jeju, Korea 2009.
    • (2009) Jeju
    • Yoda, K.1
  • 4
    • 77954791065 scopus 로고    scopus 로고
    • Towards intelligent smart grid devices with IEC 61850 interoperability and IEC 61499 open control architecture
    • submitted for New Orleans 2010
    • V. Vyatkin, G. Zhabelova, N. Higgins, K. Schwarz, N. Nair: Towards Intelligent Smart Grid Devices with IEC 61850 Interoperability and IEC 61499 Open Control Architecture; submitted for: IEEE Conference on Transmission and Distribution, New Orleans 2010 http://www.ele.auckland.ac.nz/~vyatkin/
    • IEEE Conference on Transmission and Distribution
    • Vyatkin, V.1    Zhabelova, G.2    Higgins, N.3    Schwarz, K.4    Nair, N.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.