SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

Poling effect and piezoelectric response in high-strain ferroelectric 0.70Pb (Mg1/3Nb2/3)O3 -0.30 PbTiO3 crystal

(7) Chen, H Y a Tu, C S a Hung, C M a Chien, R R b Schmidt, V H b Ku, C S c Lee, H Y c

a FU JEN CATHOLIC UNIVERSITY (Taiwan)

b MONTANA STATE UNIVERSITY (United States)

c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BEFORE AND AFTER; DIELECTRIC PERMITTIVITIES; HIGH RESOLUTION; IN-SITU; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC RESPONSE; POLARIZATION CURRENT; POLED SAMPLE; POLING EFFECT; SYNCHROTRON X RAY DIFFRACTION; TRANSITION SEQUENCES; ZERO-FIELD HEATING;

FERROELECTRIC MATERIALS; HYSTERESIS; LEAD; PIEZOELECTRICITY; POLARIZATION; SINGLE CRYSTALS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PHASE TRANSITIONS;

EID: 77956301245 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3475150 Document Type: Conference Paper

Times cited : (12)

References (23)

1
- 32944465997
- JMTSAS 0022-2461,. 10.1007/s10853-005-5914-8
- R. Blinc, V. V. Laguta, B. Zalar, and J. Banys, J. Mater. Sci. JMTSAS 0022-2461 41, 27 (2006). 10.1007/s10853-005-5914-8
- (2006) J. Mater. Sci. , vol.41 , pp. 27
- Blinc, R.¹ Laguta, V.V.² Zalar, B.³ Banys, J.⁴

2
- 34548448396
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.76.064122
- C. Stock, G. Xu, P. M. Gehring, H. Luo, X. Zhao, H. Cao, J. F. Li, D. Viehland, and G. Shirane, Phys. Rev. B PLRBAQ 0556-2805 76, 064122 (2007). 10.1103/PhysRevB.76.064122
- (2007) Phys. Rev. B , vol.76 , pp. 064122
- Stock, C.¹ Xu, G.² Gehring, P.M.³ Luo, H.⁴ Zhao, X.⁵ Cao, H.⁶ Li, J.F.⁷ Viehland, D.⁸ Shirane, G.⁹

3
- 37649027321
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.70.064107
- G. Xu, Z. Zhong, Y. Bing, Z. -G. Ye, C. Stock, and G. Shirane, Phys. Rev. B PLRBAQ 0556-2805 70, 064107 (2004). 10.1103/PhysRevB.70.064107
- (2004) Phys. Rev. B , vol.70 , pp. 064107
- Xu, G.¹ Zhong, Z.² Bing, Y.³ Ye, Z.-G.⁴ Stock, C.⁵ Shirane, G.⁶

4
- 32644458954
- PHTRDP 0141-1594,. 10.1080/02652030600558682
- G. Xu, P. M. Gehring, C. Stock, and K. Conlon, Phase Transitions PHTRDP 0141-1594 79, 135 (2006). 10.1080/02652030600558682
- (2006) Phase Transitions , vol.79 , pp. 135
- Xu, G.¹ Gehring, P.M.² Stock, C.³ Conlon, K.⁴

5
- 2942592833
- APPLAB 0003-6951,. 10.1063/1.1751216
- G. Xu, H. Hiraka, G. Shirane, and K. Ohwada, Appl. Phys. Lett. APPLAB 0003-6951 84, 3975 (2004). 10.1063/1.1751216
- (2004) Appl. Phys. Lett. , vol.84 , pp. 3975
- Xu, G.¹ Hiraka, H.² Shirane, G.³ Ohwada, K.⁴

6
- 5744248314
- JCOMEL 0953-8984,. 10.1088/0953-8984/16/39/042
- P. M. Gehring, W. Chen, Z. -G. Ye, and G. Shirane, J. Phys.: Condens. Matter JCOMEL 0953-8984 16, 7113 (2004). 10.1088/0953-8984/16/39/042
- (2004) J. Phys.: Condens. Matter , vol.16 , pp. 7113
- Gehring, P.M.¹ Chen, W.² Ye, Z.-G.³ Shirane, G.⁴

7
- 1642453541
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.68.212410
- G. Xu, D. Viehland, J. F. Li, P. M. Gehring, and G. Shirane, Phys. Rev. B PLRBAQ 0556-2805 68, 212410 (2003). 10.1103/PhysRevB.68.212410
- (2003) Phys. Rev. B , vol.68 , pp. 212410
- Xu, G.¹ Viehland, D.² Li, J.F.³ Gehring, P.M.⁴ Shirane, G.⁵

8
- 0038418033
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.67.104102
- G. Xu, Z. Zhong, Y. Bing, Z. -G. Ye, C. Stock, and G. Shirane, Phys. Rev. B PLRBAQ 0556-2805 67, 104102 (2003). 10.1103/PhysRevB.67.104102
- (2003) Phys. Rev. B , vol.67 , pp. 104102
- Xu, G.¹ Zhong, Z.² Bing, Y.³ Ye, Z.-G.⁴ Stock, C.⁵ Shirane, G.⁶

9
- 33646465119
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.73.184110
- H. Cao, J. Li, and D. Viehland, Phys. Rev. B PLRBAQ 0556-2805 73, 184110 (2006). 10.1103/PhysRevB.73.184110
- (2006) Phys. Rev. B , vol.73 , pp. 184110
- Cao, H.¹ Li, J.² Viehland, D.³

10
- 51749123081
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.78.104103
- H. Cao, C. Stock, G. Xu, P. M. Gehring, J. Li, and D. Viehland, Phys. Rev. B PLRBAQ 0556-2805 78, 104103 (2008). 10.1103/PhysRevB.78.104103
- (2008) Phys. Rev. B , vol.78 , pp. 104103
- Cao, H.¹ Stock, C.² Xu, G.³ Gehring, P.M.⁴ Li, J.⁵ Viehland, D.⁶

11
- 33746797041
- JAPIAU 0021-8979,. 10.1063/1.2220490
- Z. Feng, X. Zhao, and H. Luo, J. Appl. Phys. JAPIAU 0021-8979 100, 024104 (2006). 10.1063/1.2220490
- (2006) J. Appl. Phys. , vol.100 , pp. 024104
- Feng, Z.¹ Zhao, X.² Luo, H.³

12
- 0035858317
- APPLAB 0003-6951,. 10.1063/1.1372360
- Y. Lu, D. -Y. Jeong, Z. -Y. Cheng, Q. M. Zhang, H. Luo, Z. Yin, and D. Viehland, Appl. Phys. Lett. APPLAB 0003-6951 78, 3109 (2001). 10.1063/1.1372360
- (2001) Appl. Phys. Lett. , vol.78 , pp. 3109
- Lu, Y.¹ Jeong, D.-Y.² Cheng, Z.-Y.³ Zhang, Q.M.⁴ Luo, H.⁵ Yin, Z.⁶ Viehland, D.⁷

13
- 0037115563
- JAPIAU 0021-8979,. 10.1063/1.1524016
- D. Viehland and J. F. Li, J. Appl. Phys. JAPIAU 0021-8979 92, 7690 (2002). 10.1063/1.1524016
- (2002) J. Appl. Phys. , vol.92 , pp. 7690
- Viehland, D.¹ Li, J.F.²

14
- 22144451479
- APPLAB 0003-6951,. 10.1063/1.1957114
- M. Shanthi, K. H. Hoe, C. Y. H. Lim, and L. C. Lim, Appl. Phys. Lett. APPLAB 0003-6951 86, 262908 (2005). 10.1063/1.1957114
- (2005) Appl. Phys. Lett. , vol.86 , pp. 262908
- Shanthi, M.¹ Hoe, K.H.² Lim, C.Y.H.³ Lim, L.C.⁴

15
- 40049099426
- APPLAB 0003-6951,. 10.1063/1.2841816
- A. A. Bokov and Z. -G. Ye, Appl. Phys. Lett. APPLAB 0003-6951 92, 082901 (2008). 10.1063/1.2841816
- (2008) Appl. Phys. Lett. , vol.92 , pp. 082901
- Bokov, A.A.¹ Ye, Z.-G.²

16
- 0003427458
- 2nd ed. (Addison-Wesley, Reading, MA),.
- B. D. Cullity, Elements of X-Ray Diffraction, 2nd ed. (Addison-Wesley, Reading, MA, 1978), p. 501.
- (1978) Elements of X-Ray Diffraction , pp. 501
- Cullity, B.D.¹

17
- 0034909276
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.63.094108
- D. Vanderbilt and M. H. Cohen, Phys. Rev. B PLRBAQ 0556-2805 63, 094108 (2001). 10.1103/PhysRevB.63.094108
- (2001) Phys. Rev. B , vol.63 , pp. 094108
- Vanderbilt, D.¹ Cohen, M.H.²

18
- 0036496914
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.65.104105
- K. Hirota, Z. -G. Ye, S. Wakimoto, P. M. Gehring, and G. Shirane, Phys. Rev. B PLRBAQ 0556-2805 65, 104105 (2002). 10.1103/PhysRevB.65.104105
- (2002) Phys. Rev. B , vol.65 , pp. 104105
- Hirota, K.¹ Ye, Z.-G.² Wakimoto, S.³ Gehring, P.M.⁴ Shirane, G.⁵

19
- 33744687840
- PLRBAQ 0556-2805,. 10.1103/PhysRevB.46.8003
- D. Viehland, S. J. Jang, L. E. Cross, and M. Wuttig, Phys. Rev. B PLRBAQ 0556-2805 46, 8003 (1992). 10.1103/PhysRevB.46.8003
- (1992) Phys. Rev. B , vol.46 , pp. 8003
- Viehland, D.¹ Jang, S.J.² Cross, L.E.³ Wuttig, M.⁴

20
- 48849110204
- JAPIAU 0021-8979,. 10.1063/1.2956611
- C. -S. Tu, H. -T. Chuang, S. -C. Lee, R. R. Chien, V. H. Schmidt, and H. Luo, J. Appl. Phys. JAPIAU 0021-8979 104, 024110 (2008). 10.1063/1.2956611
- (2008) J. Appl. Phys. , vol.104 , pp. 024110
- Tu, C.-S.¹ Chuang, H.-T.² Lee, S.-C.³ Chien, R.R.⁴ Schmidt, V.H.⁵ Luo, H.⁶

21
- 55149110593
- APPLAB 0003-6951,. 10.1063/1.3012384
- C. -S. Tu, C. -M. Hsieh, V. H. Schmidt, R. R. Chien, and H. Luo, Appl. Phys. Lett. APPLAB 0003-6951 93, 172905 (2008). 10.1063/1.3012384
- (2008) Appl. Phys. Lett. , vol.93 , pp. 172905
- Tu, C.-S.¹ Hsieh, C.-M.² Schmidt, V.H.³ Chien, R.R.⁴ Luo, H.⁵

22
- 56349094836
- JAPIAU 0021-8979,. 10.1063/1.3009319
- C. -S. Tu, V. H. Schmidt, R. R. Chien, S. -H. Tsai, S. -C. Lee, and H. Luo, J. Appl. Phys. JAPIAU 0021-8979 104, 094105 (2008). 10.1063/1.3009319
- (2008) J. Appl. Phys. , vol.104 , pp. 094105
- Tu, C.-S.¹ Schmidt, V.H.² Chien, R.R.³ Tsai, S.-H.⁴ Lee, S.-C.⁵ Luo, H.⁶

23
- 42149181182
- JAPIAU 0021-8979,. 10.1063/1.2904900
- C. -S. Tu, C. -M. Hsieh, R. R. Chien, V. H. Schmidt, F. -T. Wang, and W. S. Chang, J. Appl. Phys. JAPIAU 0021-8979 103, 074117 (2008). 10.1063/1.2904900
- (2008) J. Appl. Phys. , vol.103 , pp. 074117
- Tu, C.-S.¹ Hsieh, C.-M.² Chien, R.R.³ Schmidt, V.H.⁴ Wang, F.-T.⁵ Chang, W.S.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.