SCOPUS 정보 검색 플랫폼

Volumn 141, Issue 1, 2011, Pages 325-334

Step-up test with a single cutoff for unreplicated orthogonal designs

Author keywords

Backward elimination; Experiment wise error rate; Power; Screening

Indexed keywords

EID: 77956287589 PISSN: 03783758 EISSN: None Source Type: Journal
DOI: 10.1016/j.jspi.2010.06.015 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.