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Physical Review Letters

Volumn 105, Issue 10, 2010, Pages

Fault tolerance with noisy and slow measurements and preparation

(3) Paz Silva, Gerardo A a Brennen, Gavin K a Twamley, Jason a

a MACQUARIE UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FAULTS; ERROR RATE; ERROR THRESHOLD; FAULT-TOLERANT QUANTUM COMPUTING; GATE ERRORS; MEASUREMENT SPEED; QUANTUM ERROR CORRECTIONS; UNITARY GATES;

AGRICULTURE; QUALITY ASSURANCE; QUANTUM COMPUTERS;

FAULT TOLERANCE;

EID: 77956278111 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.105.100501 Document Type: Article

Times cited : (32)

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