Characterization of composition C4 explosives using time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

Analytical Chemistry

Volumn 82, Issue 17, 2010, Pages 7237-7248

  Mahoney, Christine M ^a   Fahey, Albert J ^a   Steffens, Kristen L ^a   Benner Jr , Bruce A ^a   Lareau, Richard T ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b WILLIAM J HUGHES TECHNICAL CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL TECHNIQUES; ATOMIC CONCENTRATION; COMPLEX DATA; ENGLAND; FORENSIC APPLICATIONS; HIGH RESOLUTION; MORPHOLOGICAL STRUCTURES; MULTIVARIATE STATISTICAL ANALYSIS; PLASTIC EXPLOSIVES; SPATIAL DISTRIBUTION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS IMAGING; XPS; XPS ANALYSIS;

ATOMIC SPECTROSCOPY; MULTIVARIANT ANALYSIS; PHOTOELECTRICITY; PHOTONS; PRINCIPAL COMPONENT ANALYSIS; SECONDARY EMISSION; SIZE DISTRIBUTION; SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

SECONDARY ION MASS SPECTROMETRY;

EID: 77956245357     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac101116r     Document Type: Article

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