Intrinsic luminescence from self-trapped excitons in Bi4Ge 3O12 and bi12geo20: decay kinetics and multiplication of electronic excitations

Journal of the Physical Society of Japan

Volumn 79, Issue 7, 2010, Pages

  Itoh, Minoru ^a   Katagiri, Tsuyoshi ^a,b  

^a SHINSHU UNIVERSITY   (Japan)

^b GS Yuasa Power Supply Ltd   (Japan)

Author keywords

Auger decay; BGO; Bi12GeO20; Bi4Ge3O12; Decay kinetics; Intrinsic luminescence; Multiplication of electronic excitation; Self trapped exciton; Synchrotron radiation

Indexed keywords

EID: 77956244516     PISSN: 00319015     EISSN: 13474073     Source Type: Journal    
DOI: 10.1143/JPSJ.79.074717     Document Type: Article

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