Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition

Thin Solid Films

Volumn 518, Issue 23, 2010, Pages 6777-6780

  Chua, Ngeah Theng ^a   You, Lu ^a   Ma, Jan ^a   Wang, Junling ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

(K,Na)NbO3; Dielectric properties; Lead free piezoelectric; Morphotropic phase boundary; X ray diffraction

Indexed keywords

(K,NA)NBO3; DIELECTRIC CONSTANTS; ELECTRICAL PROPERTY; LEAD-FREE PIEZOELECTRIC; LEAD-FREE PIEZOELECTRICS; MORPHOTROPIC PHASE BOUNDARIES; ORIENTED FILMS; REMNANT POLARIZATIONS; SRTIO;

DIFFRACTION; EPITAXIAL FILMS; PHASE BOUNDARIES; PIEZOELECTRICITY; PULSED LASER DEPOSITION; PULSED LASERS; SINGLE CRYSTALS; SODIUM; TANTALUM; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 77956230881     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.06.016     Document Type: Article

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