Transport measurements on microcrystals of oriented CeIn3 and CeCoIn5 thin films

Thin Solid Films

Volumn 518, Issue 23, 2010, Pages 7064-7069

  Foyevtsov, O ^a   Reith, H ^b   Huth, M ^a  

^a GOETHE UNIVERSITY   (Germany)

^b Institut for Mikrotechnologien   (Germany)

Author keywords

Electrical Properties; Heavy Fermions; Molecular Beam Epitaxy; Scanning Electron Microscopy; Superconducting Materials; X ray Diffraction

Indexed keywords

ALTERNATIVE APPROACH; DE-WETTING; ELECTRICAL PROPERTY; ELECTRONIC TRANSPORT MEASUREMENTS; FOCUSED ION BEAM MILLING; HEAVY FERMION; HEAVY-FERMION SUPERCONDUCTOR; IN-PLANE ORIENTATION; PLANAR TUNNEL JUNCTIONS; REFERENCE COMPOUNDS; SCANNING ELECTRONS; SUBSTRATE TEMPERATURE; TRANSPORT MEASUREMENTS;

DEPOSITION; DIFFRACTION; ELECTRIC PROPERTIES; EPITAXIAL GROWTH; HEAVY FERMION SUPERCONDUCTORS; MICROCRYSTALS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SUPERCONDUCTIVITY; THIN FILMS; TUNNEL JUNCTIONS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAYS;

FILM PREPARATION;

EID: 77956229341     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.06.028     Document Type: Article

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