Thermal stability of thermoelectric Zn 4Sb 3

Journal of Electronic Materials

Volumn 39, Issue 9, 2010, Pages 1957-1959

  Yin, H ^a   Christensen, M ^a   Pedersen, B L ^a   Nishibori, E ^b   Aoyagi, S ^b   Iversen, B B ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

Rietveld refinement; synchrotron radiation; thermal stability; Thermoelectrics; Zn 4Sb 3

Indexed keywords

AFTER-HEAT TREATMENT; DOPED SAMPLE; IMPURITY PHASIS; POWER DIFFRACTION; TEMPERATURE RANGE; THERMAL STABILITY; THERMOELECTRICS; ZN 4SB 3;

DOPING (ADDITIVES); IMPURITIES; OXYGEN; RIETVELD METHOD; SYNCHROTRON RADIATION; SYNCHROTRONS; THERMODYNAMIC STABILITY; ZINC;

RIETVELD REFINEMENT;

EID: 77956226795     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-009-1053-3     Document Type: Article

References (7)

1. T Caillat J-P Fleurial A Borschevsky 1996 J. Phys. Chem. Solids 58 1119 10.1016/S0022-3697(96)00228-4 1997JPCS...58.1119C
2. GJ Snyder M Christensen E Nishibori T Caillat BB Iversen 2004 Nat. Mater. 3 458 1:CAS:528:DC%2BD2cXlt1Ors7w%3D 10.1038/nmat1154 2004NatMa...3..458S 15220913
3. T. Caillat, A. Borshchevsky, and J.-P. Fleurial, U.S. patent 6,942,728 B2 (2005).
4. LT Zhang M Tsutsui K Ike M Yamaguchi 2003 J. Alloys Compd. 358 252 1:CAS:528:DC%2BD3sXmsVKmsrk%3D 10.1016/S0925-8388(03)00074-4
5. BL Pedersen H Birkedal E Nishibori A Bentien M Sakata M Nygren PT Frederiksen BB Iversen 2007 Chem. Mater. 19 6304 1:CAS:528:DC%2BD2sXhtlSkurvK 10.1021/cm702247b
6. Y Mozharivskyj AO Pecharsky S Bud'ko GJ Miller 2004 Chem. Mater. 16 1580 1:CAS:528:DC%2BD2cXitl2rurk%3D 10.1021/cm035274a
7. BL Pedersen H Birkedal M Nygren PT Frederiksen BB Iversen 2006 Appl. Phys. Lett. 89 242108 10.1063/1.2404612 2006ApPhL..89x2108P