Structural and optical investigations of Cd1 - XZnxTe thin film

Journal of Non-Crystalline Solids

Volumn 356, Issue 31-32, 2010, Pages 1563-1568

  Dwivedi, D K ^a   Dayashankar, ^b   Singh, B B ^a   Dubey, Maheshwar ^b  

^a MMMEC ^*  (India)

^b UNIVERSITY OF LUCKNOW   (India)

Author keywords

Optical band gap; Optical transmission; SEM; Thin films; XRD

Indexed keywords

ABSORBANCES; ABSORPTION COEFFICIENTS; AMORPHOUS PHASIS; ANNEALED FILMS; ANNEALING TEMPERATURES; AS-DEPOSITED FILMS; BASE PRESSURE; CLEANED GLASS SUBSTRATES; CRYSTALLIZATION TEMPERATURE; OPTICAL INVESTIGATION; OPTICAL TRANSMISSIONS; PHOTON ENERGY; PHOTON WAVELENGTH; POLYCRYSTALLINE STRUCTURE; SEM; SPECTRAL RANGE; TEMPERATURE RANGE; VACUUM EVAPORATION TECHNIQUE; XRD;

AMORPHOUS FILMS; ANNEALING; ENERGY GAP; LIGHT TRANSMISSION; OPTICAL BAND GAPS; PHOTONS; SUBSTRATES; TELLURIUM COMPOUNDS; THIN FILMS; VACUUM EVAPORATION; VAPOR DEPOSITION; ZINC;

OPTICAL FILMS;

EID: 77956226073     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2010.05.061     Document Type: Article

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