Degradation evaluation of α-IGZO TFTs for application to AM-OLEDs

IEEE Electron Device Letters

Volumn 31, Issue 9, 2010, Pages 963-965

  Kimura, Mutsumi ^a   Imai, Shinji ^b  

^a RYUKOKU UNIVERSITY   (Japan)

^b Frontier Core Technology Laboratories   (Japan)

Author keywords

IGZO; Active matrix organic light emitting diode displays (AM OLEDs); degradation evaluation; driving TFTs (Dr TFTs); switching TFTs (Sw TFTs); thin film transistors (TFTs); trap densities

Indexed keywords

ACTIVE MATRIX ORGANIC LIGHT EMITTING DIODES; C-V CURVE; CAPACITANCE VOLTAGE; CHANNEL LAYERS; CURRENT STRESS; CURRENT VOLTAGE; DRIVING TFTS (DR-TFTS); EXTRACTION TECHNIQUES; GATE INSULATOR; GATE VOLTAGES; I - V CURVE; TRAP DENSITY; TRAP GENERATION;

DEGRADATION; DIODES; DRAIN CURRENT; LIGHT EMISSION; LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED);

THIN FILM TRANSISTORS;

EID: 77956178299     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2010.2052235     Document Type: Article

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