Radiation damage effects in layered thin film MgO/HfO2 structures

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 19, 2010, Pages 3044-3048

  Usov, I O ^a   Won, J ^a   Valdez, J A ^a   Hawley, M E ^a   Devlin, D J ^a   Jarvinen, G D ^a   Sickafus, K E ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Hafnia; Ion irradiation; Magnesia

Indexed keywords

BULK MATERIALS; CHEMICAL COMPOSITIONS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FLUENCE RANGE; GRAZING-INCIDENCE X-RAY DIFFRACTION; HAFNIA; ION IRRADIATION; LAYERED THIN FILMS; MICRO-STRUCTURAL; MODEL REPRESENTATION; PHASE TRANSFORMATION; RADIATION DAMAGE BEHAVIOR; RADIATION DAMAGE EFFECTS; ROOM TEMPERATURE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TEM; TETRAGONAL HFO; TRILAYER STRUCTURE; TRILAYERS; WASTE FORMS;

IONS; IRRADIATION; MAGNESIA; RADIATION DAMAGE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; SOLIDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

HAFNIUM COMPOUNDS;

EID: 77956178127     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.05.036     Document Type: Conference Paper

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