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Volumn 268, Issue 19, 2010, Pages 2870-2873

Effect of inter-atomic Auger processes on relaxation of electronic vacancies at deep levels of highly ionized atoms in swift heavy ion tracks

Author keywords

Auger; Electronic excitations; Monte Carlo; Sift heavy ion; Track; X ray emission

Indexed keywords

AUGER PROCESS; DEEP LEVEL; ELECTRONIC EXCITATION; ELECTRONIC SUBSYSTEMS; GASEOUS TARGETS; HIGHLY-IONIZED; K-SHELL EMISSION; MONTE CARLO; MONTE CARLO SIMULATION; NUMERICAL RESULTS; RELAXATION KINETICS; SILICON ATOMS; SWIFT HEAVY ION TRACKS; SWIFT HEAVY IONS; TRACK; X-RAY EMISSION;

EID: 77956174570     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.03.021     Document Type: Conference Paper
Times cited : (21)

References (14)
  • 2
    • 33746065851 scopus 로고    scopus 로고
    • F.F. Komarov Phys.-Uspekhi 46 12 2003 1253 (Usp. Fiz. Nauk 12 (2003) 1287)
    • (2003) Phys.-Uspekhi , vol.46 , Issue.12 , pp. 1253
    • Komarov, F.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.