Effect of annealing on atomic ordering of amorphous ZrTaTiNbSi alloy

Applied Physics Letters

Volumn 95, Issue 24, 2009, Pages

  Yang, Tsung Han ^a,c   Huang, Rong Tang ^b   Wu, Cheng An ^a   Chen, Fu Rong ^a   Gan, Jon Yiew ^a   Yeh, Jien Wei ^a   Narayan, Jagdish ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS STRUCTURES; ANNEALING TEMPERATURES; ATOMIC ORDERING; BONDING REACTIONS; DEGREE OF DISORDER; INITIAL STAGES; LOCAL ATOMIC ARRANGEMENTS; METAL SPECIES; PHASE TRANSFORMATION; STRUCTURAL CHANGE; STRUCTURE EVOLUTION; TEMPERATURE RANGE;

ANNEALING; ATOMS; BOND LENGTH; CERIUM ALLOYS; CRYSTAL ATOMIC STRUCTURE; DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY; SILICON; SILICON ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

AMORPHOUS FILMS;

EID: 77956159767     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3273387     Document Type: Article

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