X-Ray Beam Damage of Nafion (perfluorosulfonate ionomer)

Surface Science Spectra

Volumn 10, Issue 1, 2003, Pages 117-126

  Militello, Maria C ^a   Gaarenstroom, Stephen W ^a  

^a GENERAL MOTORS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHAINS;

BEAM DAMAGE; END GROUPS; NAFIONS; PERFLUOROETHERS; PERFLUOROSULFONATE IONOMER MEMBRANES; PERFLUOROSULFONATE IONOMERS; SIDE-CHAINS; SULPHONATES; X-RAY BEAM; XPS SPECTRUM;

IONOMERS;

EID: 77956148210     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20031001     Document Type: Article

References (2)

1. M.Schulze, M.Lorenz, N.Wagner, and E.Gulzow, Fresenius J. Anal. Chem. 365, 106 (1999). 10.1007/s002160051454
2. G.Beamson and D.Briggs, High Resolution XPS of Organic Polymers: The Scienta ESCA 300 Database (Wiley, Chichester UK, 1992).