Structural, thermal and magnetic properties of thin metal films and adsorbate-substrate systems studied by XAFS and XMCD

Topics in Catalysis

Volumn 18, Issue 1-2, 2002, Pages 9-14

  Yokoyama, Toshihiko ^a   Ohta, Toshiaki ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

CO; Epitaxial film; Magnetic anisotropy; Molecular orientation; Orbital magnetic moment; SO2; Surface structure; X ray absorption fine structure (XAFS); X ray magnetic circular dichroism (XMCD)

Indexed keywords

ATOMIC PHYSICS; COBALT; COPPER COMPOUNDS; DICHROISM; ELECTRONIC STRUCTURE; EPITAXIAL FILMS; EPITAXIAL GROWTH; MAGNETIC ANISOTROPY; MAGNETIC MOMENTS; MAGNETIC STORAGE; METALLIC FILMS; MOLECULAR ORIENTATION; NICKEL; PALLADIUM; SINGLE CRYSTALS; SPECTROSCOPY; SUBSTRATES; SURFACE STRUCTURE; X RAY ABSORPTION;

ADSORBATE-SUBSTRATE SYSTEM; ADSORPTION GEOMETRIES; ORBITAL MAGNETIC MOMENT; ORBITAL MOMENT; STRUCTURAL AND MAGNETIC PROPERTIES; THIN METAL FILMS; X RAY ABSORPTION FINE STRUCTURES; X-RAY MAGNETIC CIRCULAR DICHROISM;

STRUCTURAL PROPERTIES;

EID: 77956136987     PISSN: 10225528     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1013869830991     Document Type: Conference Paper

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