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Volumn 2002-January, Issue , 2002, Pages 10-13

Very low-voltage, low-power and fast-settling OTA for switched-capacitor applications

Author keywords

Batteries; CMOS digital integrated circuits; CMOS technology; Energy consumption; Frequency; Mirrors; Operational amplifiers; Power dissipation; Switched capacitor circuits; Voltage

Indexed keywords

ANALOG CIRCUITS; CAPACITORS; CMOS INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC LOSSES; ELECTRIC POTENTIAL; ENERGY DISSIPATION; ENERGY UTILIZATION; MICROELECTRONICS; MIRRORS; OPERATIONAL AMPLIFIERS; POWER AMPLIFIERS; SOLAR CELLS;

EID: 77956003000     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICM-02.2002.1161485     Document Type: Conference Paper
Times cited : (14)

References (6)
  • 1
    • 0035273851 scopus 로고    scopus 로고
    • Very low-voltage digital-audio ΔΣ modulator with 88-dB dynamic range using local switch bootstrapping
    • March
    • M. Dessouky and A. Kaiser, "Very low-voltage digital-audio ΔΣ modulator with 88-dB dynamic range using local switch bootstrapping," IEEE J. Solid-State Circuits, vol. 36, no. 3, pp. 349-355, March 2001.
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.3 , pp. 349-355
    • Dessouky, M.1    Kaiser, A.2
  • 2
    • 0031169153 scopus 로고    scopus 로고
    • A 1.8-V digital-audio sigma-delta modulator in 0.8-μm CMOS
    • June
    • Shahriar Rabii and B. Wooley, "A 1.8-V digital-audio sigma-delta modulator in 0.8-μm CMOS," IEEE J. Solid-State Circuits, vol. 32, no. 6, pp. 783-796, June 1997.
    • (1997) IEEE J. Solid-State Circuits , vol.32 , Issue.6 , pp. 783-796
    • Rabii, S.1    Wooley, B.2
  • 3
    • 0020906580 scopus 로고
    • An improved frequency compensation technique for CMOS operational amplifiers
    • Dec
    • B. Ahuja, "An improved frequency compensation technique for CMOS operational amplifiers," IEEE J. Solid-State Circuits, vol. 18, Dec. 1983.
    • (1983) IEEE J. Solid-State Circuits , vol.18
    • Ahuja, B.1
  • 6
    • 0022787114 scopus 로고
    • Hot-electron effects on channel thermal noise in fine-line NMOS field-effect transistors
    • Sep
    • R. Jindal, "Hot-electron effects on channel thermal noise in fine-line NMOS field-effect transistors," IEEE Trans. Electron Devices, vol. ED-33, pp. 1395-1397, Sep. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 1395-1397
    • Jindal, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.