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Volumn 63, Issue 9, 2010, Pages 921-924
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Microstructure instability in cryogenically deformed copper
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Author keywords
Copper; Cryogenic deformation; Electron backscatter diffraction; Nanocrystalline microstructure
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Indexed keywords
ABNORMAL GRAIN GROWTH;
CRYOGENIC DEFORMATION;
DEFORMED COPPER;
ELECTRON BACKSCATTER DIFFRACTION;
HIGH RESOLUTION;
MICROSTRUCTURAL STABILITY;
NANOCRYSTALLINE MICROSTRUCTURES;
ROOM TEMPERATURE;
STATIC STORAGE;
BACKSCATTERING;
COPPER;
CRYOGENICS;
DEFORMATION;
ELECTRON DIFFRACTION;
GRAIN SIZE AND SHAPE;
LOW TEMPERATURE PHENOMENA;
MICROSTRUCTURE;
GRAIN GROWTH;
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EID: 77955982420
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2010.07.005 Document Type: Article |
Times cited : (39)
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References (9)
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