Femtosecond off-axis digital holography for monitoring dynamic surface deformation

Applied Optics

Volumn 49, Issue 13, 2010, Pages 2510-2518

  Zhu, Linwei ^a   Zhou, Changhe ^a   Wu, Tengfei ^a   Jia, Wei ^a   Fan, Zhongwei ^b,c   Ma, Yunfeng ^c,d   Niu, Gang ^b  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b Beijing GK Laser Technology Company   (China)

^c CHINESE ACADEMY OF SCIENCES   (China)

^d UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABLATION; DEFORMATION; HOLOGRAMS; HOLOGRAPHY; INTERFEROMETERS; LASER ABLATION; LASER PULSES; LASER RECORDING; METALLIC FILMS; METALS; MICHELSON INTERFEROMETERS; REFRACTION; SURFACE TREATMENT; ULTRAFAST LASERS;

ABLATION THRESHOLDS; DIGITAL HOLOGRAMS; DYNAMIC SURFACE; OFF-AXIS DIGITAL HOLOGRAPHIES; PHYSICAL PROCESS; REFRACTION INDEX; SURFACE CHANGES; SURFACE DEFORMATION;

ULTRASHORT PULSES;

EID: 77955970919     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.002510     Document Type: Article

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