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Materials Research Society Symposium Proceedings

Volumn 1222, Issue , 2010, Pages 105-110

Measuring the Young's relaxation modulus of PDMS using stress relaxation nanoindentation

(3) Du, Ping a Lu, Hongbing b Zhang, Xin a

a Boston University (United States)

b Center for Advanced Research and Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL SOLUTIONS; CONSTITUTIVE LAW; EXPERIMENTAL TEST; FLAT PUNCHES; FORCE-DISPLACEMENT DATA; INDENTERS; MAXWELL MODELS; MICRO PILLARS; NANOINDENTERS; POLYDIMETHYLSILOXANE PDMS; REACTION FORCES; RELAXATION FUNCTIONS; RELAXATION MODULUS; STRESS RELAXATION TESTS; VISCOELASTIC CONTACT;

BENDING TESTS; ELECTROMECHANICAL DEVICES; MEMS; MICROCHANNELS; NANOINDENTATION; RESIDUAL STRESSES; STRESS RELAXATION; TESTING;

SILICONES;

EID: 77955936305 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (5)

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