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Soft Matter

Volumn 6, Issue 2, 2010, Pages 239-242

Measuring short-range repulsive forces by imaging directed magnetic-particle assembly title

(3) Li, Dichuan a Lam, Christopher N a Biswal, Sibani L a

a Rice University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3-5 MICRON; CHARGED COLLOIDS; COATED SURFACE; COLLOIDAL PARTICLE; DISTANCE RESOLUTION; DLVO THEORY; FORCE INTERACTION; MAGNETIC FIELD STRENGTHS; PARTICLE ASSEMBLIES; POLYMER BRUSHES; REPULSIVE FORCES; USE OF VIDEO;

BRUSHES; COLLOIDS; MAGNETIC FIELDS;

OLIGONUCLEOTIDES;

EID: 77955893329 PISSN: 1744683X EISSN: 17446848 Source Type: Journal
DOI: 10.1039/b917675f Document Type: Article

Times cited : (19)

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