Spatially mapping random lasing cavities

Optics Letters

Volumn 35, Issue 16, 2010, Pages 2801-2803

  Poison, R C ^a   Vardeny, Z V ^a  

^a UNIVERSITY OF UTAH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISORDERED SOLIDS; EMISSION PEAKS; EMISSION SPECTRUMS; EXCITATION INTENSITY; FOURIER TRANSFORM ANALYSIS; MAPPING TECHNIQUES; RANDOM LASERS; RANDOM LASING; RESONANT MICROCAVITIES; SPATIAL EXTENT; THRESHOLD INTENSITY;

EMISSION SPECTROSCOPY; FOURIER TRANSFORMS; LASER BEAMS; MAPPING; MICROCAVITIES;

LASER EXCITATION;

EID: 77955882205     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.002801     Document Type: Article

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