메뉴 건너뛰기




Volumn 108, Issue 3, 2010, Pages

Effects of morphology and strain on the dielectric response of multiferroic CoFe2O4-BaTiO3 nanocomposite thin films

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION TEMPERATURES; DIELECTRIC PERMITTIVITIES; DIELECTRIC RESPONSE; FERROELECTRIC PHASE; FUNCTIONAL OPTIMIZATION; GRAIN SIZE; MATRIX; MICROSTRUCTURAL ANALYSIS; MULTIFERROICS; NANOCOMPOSITE THIN FILMS; PERMITTIVITY AND LOSS; STRUCTURE AND MORPHOLOGY; UNIT-CELL VOLUME;

EID: 77955877796     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3462449     Document Type: Article
Times cited : (16)

References (27)
  • 1
    • 33846006566 scopus 로고    scopus 로고
    • Multiferroics: Progress and prospects in thin films
    • DOI 10.1038/nmat1805, PII NMAT1805
    • R. Ramesh and N. A. Spaldin, Nature Mater. NMAACR 1476-1122 6, 21 (2007). 10.1038/nmat1805 (Pubitemid 46043269)
    • (2007) Nature Materials , vol.6 , Issue.1 , pp. 21-29
    • Ramesh, R.1    Spaldin, N.A.2
  • 2
    • 0034229229 scopus 로고    scopus 로고
    • JPCBFK 1089-5647, 10.1021/jp000114x
    • N. A. Hill, J. Phys. Chem. B JPCBFK 1089-5647 104, 6694 (2000). 10.1021/jp000114x
    • (2000) J. Phys. Chem. B , vol.104 , pp. 6694
    • Hill, N.A.1
  • 4
    • 33747623307 scopus 로고    scopus 로고
    • Multiferroic and magnetoelectric materials
    • DOI 10.1038/nature05023, PII NATURE05023
    • W. Eerenstein, N. D. Mathur, and J. F. Scott, Nature (London) NATUAS 0028-0836 442, 759 (2006). 10.1038/nature05023 (Pubitemid 44261898)
    • (2006) Nature , vol.442 , Issue.7104 , pp. 759-765
    • Eerenstein, W.1    Mathur, N.D.2    Scott, J.F.3
  • 14
    • 21844455788 scopus 로고    scopus 로고
    • 3 thin films
    • DOI 10.1016/j.tsf.2004.10.058, PII S0040609004018917
    • M. Jimi, T. Ohnishi, K. Terai, M. Kawasaki, and M. Lippmaa, Thin Solid Films THSFAP 0040-6090 486, 158 (2005). 10.1016/j.tsf.2004.10.058 (Pubitemid 40952560)
    • (2005) Thin Solid Films , vol.486 , Issue.1-2 , pp. 158-161
    • Jimi, M.1    Ohnishi, T.2    Terai, K.3    Kawasaki, M.4    Lippmaa, M.5
  • 18
    • 42749103878 scopus 로고    scopus 로고
    • PLRBAQ 0556-2805, 10.1103/PhysRevB.70.045403
    • U. Lüders, F. Sánchez, and J. Fontcuberta, Phys. Rev. B PLRBAQ 0556-2805 70, 045403 (2004). 10.1103/PhysRevB.70.045403
    • (2004) Phys. Rev. B , vol.70 , pp. 045403
    • Lüders, U.1    Sánchez, F.2    Fontcuberta, J.3
  • 21
    • 63749128691 scopus 로고    scopus 로고
    • JAPIAU 0021-8979, 10.1063/1.3056160
    • Z. Tan, J. Slutsker, and A. L. Roytburd, J. Appl. Phys. JAPIAU 0021-8979 105, 061615 (2009). 10.1063/1.3056160
    • (2009) J. Appl. Phys. , vol.105 , pp. 061615
    • Tan, Z.1    Slutsker, J.2    Roytburd, A.L.3
  • 25
    • 0031377396 scopus 로고    scopus 로고
    • IFEREU 1058-4587, 10.1080/10584589708015695
    • R. Waser, Integr. Ferroelectr. IFEREU 1058-4587 15, 39 (1997). 10.1080/10584589708015695
    • (1997) Integr. Ferroelectr. , vol.15 , pp. 39
    • Waser, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.