Extreme value statistics in silicon photonics

IEEE Photonics Journal

Volumn 1, Issue 1, 2009, Pages 33-39

  Borlaug, D ^a   Fathpour, S ^a,b   Jalali, B ^a  

^a University of California   (United States)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

Extreme value statistics; L shape probability distribution; Raman scattering; Silicon photonics

Indexed keywords

COHERENT ANTI-STOKES RAMAN SCATTERING; EXTREME EVENTS; EXTREME VALUE STATISTICS; L-SHAPE PROBABILITY DISTRIBUTION; NATURAL DISASTERS; NON-GAUSSIAN; ROGUE WAVES; SILICON PHOTONICS; STOCK MARKET;

BIOLOGICAL SYSTEMS; DISASTERS; PHOTONIC DEVICES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCATTERING;

PROBABILITY DISTRIBUTIONS;

EID: 77955866575     PISSN: 19430655     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOT.2009.2025517     Document Type: Article

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