Metrics selection for fault-proneness prediction of software modules

2010 International Conference on Computer Design and Applications, ICCDA 2010

Volumn 2, Issue , 2010, Pages

  Luo, Yunfeng ^a   Ben, Kerong ^a  

^a NAVAL UNIVERSITY OF ENGINEERING   (China)

Author keywords

Correlation analysis; Fault proneness; Gray relational analysis; Metrics selection

Indexed keywords

CORRELATION ANALYSIS; DATA SETS; FAULT-PRONENESS; FAULT-PRONENESS PREDICTION; GRAY RELATIONAL ANALYSIS; LOGISTIC REGRESSION MODELS; METRICS SELECTION; PUBLIC DOMAINS; SOFTWARE MODULES;

COMPUTER APPLICATIONS; DATA FLOW ANALYSIS; FORECASTING; NASA; REGRESSION ANALYSIS;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 77955856660     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCDA.2010.5541206     Document Type: Conference Paper

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