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Volumn 7, Issue 7-8, 2010, Pages 1781-1783

Atom probe extended to AlGaN: Three-dimensional imaging of a Mg-doped AlGaN/GaN superlattice

Author keywords

AlGaN GaN; Doping; Laser deposition; SIMS; Superlattices

Indexed keywords

ALUMINUM GALLIUM NITRIDE; ATOM LASERS; DOPING (ADDITIVES); GALLIUM NITRIDE; III-V SEMICONDUCTORS; MAGNESIUM; NITRIDES; PROBES; PULSED LASERS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR ALLOYS; SEMICONDUCTOR DOPING; SEMICONDUCTOR LASERS; SUPERLATTICES;

EID: 77955785225     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200983510     Document Type: Conference Paper
Times cited : (5)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.