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Volumn , Issue , 2010, Pages 94-99

A large scale characterization of RO-PUF

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATE RESULTS; DATA SETS; EXPERIMENTAL DATA; LARGE POPULATION; LOOP DELAY; NORMAL OPERATING CONDITIONS; ON CHIPS; PHYSICAL UNCLONABLE FUNCTIONS; QUALITY FACTORS; RESEARCH COMMUNITIES; RING OSCILLATOR; SCALE CHARACTERIZATION; SIMULATION METHODS;

EID: 77955766025     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HST.2010.5513108     Document Type: Conference Paper
Times cited : (331)

References (7)
  • 1
    • 34547307341 scopus 로고    scopus 로고
    • Physical Unclonable Functions for Device Authentication and Secret Key Generation
    • ACM Press
    • G.E. Suh and S. Devadas, "Physical Unclonable Functions for Device Authentication and Secret Key Generation," Proc. 44th Design Automation Conf. (DAC 07), ACM Press, pp. 9-14.
    • Proc. 44th Design Automation Conf. (DAC 07) , pp. 9-14
    • Suh, G.E.1    Devadas, S.2
  • 3
    • 34548818732 scopus 로고    scopus 로고
    • A 1.6pJ/bit 96% Stable Chip ID Generating Circuit Using Process Variations
    • IEEE Press, 611
    • Y. Su, J. Holleman, and B. Otis, "A 1.6pJ/bit 96% Stable Chip ID Generating Circuit Using Process Variations," Proc. IEEE Int'l Solid-State Circuits Conf. (ISSCC 07), IEEE Press, 2007, pp. 406-407, 611.
    • (2007) Proc. IEEE Int'l Solid-State Circuits Conf. (ISSCC 07) , pp. 406-407
    • Su, Y.1    Holleman, J.2    Otis, B.3
  • 4
    • 68949175522 scopus 로고    scopus 로고
    • Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers
    • Daniel E. Holcomb, Wayne P. Burleson, Kevin Fu, "Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers," IEEE Trans on Computers, vol. 58, no. 9, pp. 1198-1210.
    • IEEE Trans on Computers , vol.58 , Issue.9 , pp. 1198-1210
    • Holcomb, D.E.1    Burleson, W.P.2    Fu, K.3
  • 5
    • 33645792117 scopus 로고    scopus 로고
    • Variability: Modeling and its impact on design
    • H.Onodera, "Variability: Modeling and its impact on design," IEICE Trans. Electron, E89-C, p.342 (2006)..
    • (2006) IEICE Trans. Electron , vol.E89-C , pp. 342
    • Onodera, H.1
  • 7
    • 70449953978 scopus 로고    scopus 로고
    • Towards a unique FPGA-based identification circuit using process variations
    • Yu, H.; Leong, P.H.W.; Hinkelmann, H.; Moller, L.; Glesner, M.; Zipf, P.; "Towards a unique FPGA-based identification circuit using process variations," FPL 2009., pp.397-402
    • FPL 2009 , pp. 397-402
    • Yu, H.1    Leong, P.H.W.2    Hinkelmann, H.3    Moller, L.4    Glesner, M.5    Zipf, P.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.