Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

Applied Physics Letters

Volumn 97, Issue 4, 2010, Pages

  Greenlee, Charles ^a   Guilmo, Anael ^a   Opadeyi, Ayodeji ^a   Himmelhuber, Roland ^a   Norwood, Robert A ^a   Fallahi, Mahmoud ^a   Luo, Jingdong ^b   Huang, Su ^b   Zhou, Xing Hua ^b   Jen, Alex K Y ^b   Peyghambarian, Nasser ^a  

^a UNIVERSITY OF ARIZONA   (United States)

^b University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS POLYCARBONATES; COMMONLY USED; DATA FITS; ELECTRO-OPTICS; GUEST-HOST; MACH ZEHNDER INTERFEROMETRY; PIEZO-ELECTRIC EFFECTS; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC TENSOR; POLED POLYMER FILMS; REFLECTION ELLIPSOMETRY; SECOND-ORDER SUSCEPTIBILITY; TWO-LEVEL MODELS;

ELLIPSOMETRY; INTERFEROMETRY; PIEZOELECTRICITY; PLASTIC FILMS; POLYMERS; TENSORS;

POLYMER FILMS;

EID: 77955753389     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3467847     Document Type: Article

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