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Volumn 97, Issue 5, 2010, Pages

Suppression of boron-oxygen defects in p-type Czochralski silicon by germanium doping

Author keywords

[No Author keywords available]

Indexed keywords

BORON-OXYGEN; BORON-OXYGEN DEFECTS; CZOCHRALSKI SILICON; DEFECT CONCENTRATIONS; GE CONTENT; GERMANIUM DOPING; P-TYPE; POWER OUT PUT;

EID: 77955730204     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3475486     Document Type: Article
Times cited : (31)

References (19)
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