Detection of multiple cracks on a partially obstructed plate structure following the probabilistic approach

AIP Conference Proceedings

Volumn 1233, Issue PART 1, 2010, Pages 53-58

  Yin, T ^a   Lam, H F ^a   Chow, H M ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Bayesian Statistical Identification Framework; Crack Detection; Model Class Selection; Multiple Cracks; Plate

Indexed keywords

EID: 77955724517     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3452230     Document Type: Conference Paper

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