Ultrafast dynamics of antiferromagnetic order studied by femtosecond resonant soft x-ray diffraction

Applied Physics Letters

Volumn 97, Issue 6, 2010, Pages

  Holldack, K ^a   Pontius, N ^a   Schierle, E ^a   Kachel, T ^a   Soltwisch, V ^a   Mitzner, R ^a   Quast, T ^a   Springholz, G ^b   Weschke, E ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANTIFERROMAGNETIC ORDERS; BRAGG PEAK INTENSITIES; DIFFRACTION PEAKS; FAST RECOVERY; FEMTOSECONDS; MAGNETIC CORRELATION; ORDER PARAMETER; PICOSECONDS; RECIPROCAL SPACE; SOFT X-RAY; TIME CONSTANTS; TIME RESOLUTION; ULTRA-FAST; ULTRA-FAST DYNAMICS; ULTRAFAST DECAY; UPPER LIMITS;

ANTIFERROMAGNETIC MATERIALS; ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; EUROPIUM; LASER EXCITATION; MAGNETIC SEMICONDUCTORS; X RAY DIFFRACTION;

DIFFRACTION;

EID: 77955722231     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3474612     Document Type: Article

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